<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Gupta, Shekhar</style></author><author><style face="normal" font="default" size="100%">Van Gemund, Arjan JC</style></author><author><style face="normal" font="default" size="100%">Rui Abreu</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Probabilistic Error Propagation Modeling in Logic Circuits</style></title><secondary-title><style face="normal" font="default" size="100%">IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops - ICSTW</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2011</style></year><pub-dates><date><style  face="normal" font="default" size="100%">March</style></date></pub-dates></dates><urls><related-urls><url><style face="normal" font="default" size="100%">https://haslab.uminho.pt/sites/default/files/ruimaranhao/files/tebug2011_submission_6.pdf</style></url></related-urls></urls><publisher><style face="normal" font="default" size="100%">IEEE</style></publisher><pub-location><style face="normal" font="default" size="100%">Berlin, Germany.</style></pub-location><pages><style face="normal" font="default" size="100%">617–623</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;Recent study has shown that accurate knowledge of the false negative rate (FNR) of tests can significantly improve the diagnostic accuracy of spectrum-based fault localization. To understand the principles behind FNR modeling in this paper we study three error propagation probability (EPP) modeling approaches applied to a number of logic circuits from the 74XXX/ISCAS-85 benchmark suite. Monte Carlo simulations for random injected faults show that a deterministic approach that models gate behavior provides high accuracy (O(1%)), while probabilistic approaches that abstract from gate modeling generate higher prediction errors (O(10%)), which increase with the number of injected faults.&lt;/p&gt;
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