<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Rui Abreu</style></author><author><style face="normal" font="default" size="100%">González, Alberto</style></author><author><style face="normal" font="default" size="100%">Zoeteweij, Peter</style></author><author><style face="normal" font="default" size="100%">Van Gemund, Arjan JC</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Automatic software fault localization using generic program invariants</style></title><secondary-title><style face="normal" font="default" size="100%">Proceedings of the 2008 ACM symposium on Applied computing</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2008</style></year><pub-dates><date><style  face="normal" font="default" size="100%">March</style></date></pub-dates></dates><urls><related-urls><url><style face="normal" font="default" size="100%">https://haslab.uminho.pt/sites/default/files/ruimaranhao/files/sac08.pdf</style></url></related-urls></urls><publisher><style face="normal" font="default" size="100%">ACM</style></publisher><pub-location><style face="normal" font="default" size="100%">Ceará, Brazil</style></pub-location><pages><style face="normal" font="default" size="100%">712–717</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of low-cost, generic invariants (&quot;screeners&quot;) in their capacity of error detectors within a spectrum-based fault localization (SFL) approach aimed to diagnose program defects in the operational phase. The screeners considered are simple bit-mask and range invariants that screen every load/store and function argument/return program point. Their generic nature allows them to be automatically instrumented without any programmer-effort, while training is straightforward given the test cases available in the development phase. Experiments based on the Siemens program set demonstrate diagnostic performance that is similar to the traditional, development-time application of SFL based on the program pass/fail information known before-hand. This diagnostic performance is currently attained at an average 14% screener execution time overhead, but this overhead can be reduced at limited performance penalty.&lt;/p&gt;
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