@conference {zoeteweij2008automated,
	title = {Automated fault diagnosis in embedded systems},
	booktitle = {Second International Conference on Secure System Integration and Reliability Improvement - SSIRI},
	year = {2008},
	month = {July},
	pages = {103{\textendash}110},
	publisher = {IEEE},
	organization = {IEEE},
	address = {Yokohama, Japan},
	abstract = {<p>Automated fault diagnosis is emerging as an important factor in achieving an acceptable and competitive cost/dependability ratio for embedded systems. In this paper, we introduce model-based diagnosis and spectrum-based fault localization, two state-of-the-art approaches to fault diagnosis that jointly cover the combination of hardware and control software typically found in embedded systems. In this paper we present an introduction to the eld, discuss our recent research results, and report on the application on industrial test cases.</p>
},
	attachments = {https://haslab.uminho.pt/sites/default/files/ruimaranhao/files/zpafg_bces07.pdf},
	author = {Zoeteweij, Peter and Pietersma, Jurryt and Rui Abreu and Feldman, Alexander and Van Gemund, Arjan JC}
}