@conference {abreu2008automatic,
	title = {Automatic software fault localization using generic program invariants},
	booktitle = {Proceedings of the 2008 ACM symposium on Applied computing},
	year = {2008},
	month = {March},
	pages = {712{\textendash}717},
	publisher = {ACM},
	organization = {ACM},
	address = {Cear{\'a}, Brazil},
	abstract = {<p>Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of low-cost, generic invariants ("screeners") in their capacity of error detectors within a spectrum-based fault localization (SFL) approach aimed to diagnose program defects in the operational phase. The screeners considered are simple bit-mask and range invariants that screen every load/store and function argument/return program point. Their generic nature allows them to be automatically instrumented without any programmer-effort, while training is straightforward given the test cases available in the development phase. Experiments based on the Siemens program set demonstrate diagnostic performance that is similar to the traditional, development-time application of SFL based on the program pass/fail information known before-hand. This diagnostic performance is currently attained at an average 14\% screener execution time overhead, but this overhead can be reduced at limited performance penalty.</p>
},
	attachments = {https://haslab.uminho.pt/sites/default/files/ruimaranhao/files/sac08.pdf},
	author = {Rui Abreu and Gonz{\'a}lez, Alberto and Zoeteweij, Peter and Van Gemund, Arjan JC}
}